ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,673, issued on Jan. 13, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).
"Automatic analysis device" was invented by Shun Kuriki (Tokyo), Kazuhiro Noda (Tokyo) and Yukinori Sakashita (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an automatic analyzer capable of reducing risks such as infection, injury, and damage to the device caused by manual operation of a user. In the automatic analyzer according to the present disclosure, an unused vessel holding unit is configured to be able to hold a cleaning member that cleans a hole for mounting a reaction vessel, and a reaction vessel transport unit or a specimen probe picks up the clean...