US Patent Issued to Hitachi High-Tech on Feb. 4 for "Charged particle beam apparatus and cell evaluation method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,215,308, issued on Feb. 4, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Charged particle beam apparatus and cell evaluation method" was invented by Akira Ikeuchi (Tokyo), Shigeru Kawamata (Tokyo), Hiromi Mise (Tokyo) and Akira Sawaguchi (Miyazaki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a charged particle beam apparatus capable of more objectively and highly accurately calculating a feature of a cell from an observation image of a cell and evaluating a cell. The charged particle beam apparatus includes an image acquisition unit 18 that acquires an image of a cell, a contour extraction unit 19 that extracts a contour of the i...