US Patent Issued to Hitachi High-Tech on Dec. 30 for "Particle measurement device, particle measurement method, sample container" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,459, issued on Dec. 30, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Particle measurement device, particle measurement method, sample container" was invented by Hiroyuki Minemura (Tokyo), Yumiko Anzai (Tokyo) and Kentaro Osawa (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the invention is to improve measurement accuracy depending on a refractive index while reducing a burden of a user inputting a refractive index of a particle or a refractive index of a solvent to a measurement device in a case of measuring a size or density of the particle by light irradiation. A particle measurement device according to the invention speci...