US Patent Issued to HITACHI HIGH-TECH on Dec. 30 for "Mass spectrometer and method for controlling same" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,309, issued on Dec. 30, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Mass spectrometer and method for controlling same" was invented by Masuyuki Sugiyama (Tokyo), Hideki Hasegawa (Tokyo), Yuka Sugawara (Tokyo), Riku Tamura (Tokyo), Hiroyuki Yasuda (Tokyo) and Yuichiro Hashimoto (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a mass spectrometer and a method for controlling the same capable of suppressing decrease in sensitivity even where the atmospheric pressure around the mass spectrometer varies. The mass spectrometer includes an ion source, a mass analysis unit, a control unit, and a storage unit. The ion source includes ...