ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,827, issued on Aug. 26, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).
"Charged particle beam device" was invented by Teruo Kohashi (Tokyo), Hideo Morishita (Tokyo), Tatsuro Ide (Tokyo) and Junichi Katane (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "To implement a charged particle beam device including an iron thin film spin detector. The charged particle beam device includes: a charged particle column 201 configured to perform scanning on a sample 203 with a charged particle beam 202; a spin detector including an iron thin film 207, a plurality of coils 208 configured to magnetize the iron thin film, a conveying lens 206 configured to fo...