ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,741, issued on Aug. 19, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Component analysis apparatus and component analysis method" was invented by Yoshiki Yonamoto (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "To provide an optical nuclear magnetic resonance apparatus in which a cleaning mechanism that can be mounted on an apparatus for performing an optical magnetic resonance method and can remove deposits on a sensor surface is mounted, and removal of contamination of the sensor surface can be determined. In a component analysis apparatus according to the present invention, a sensor includes therein a defect having an electron spin that...