US Patent Issued to HITACHI HIGH-TECH on Aug. 12 for "Charged particle detector, charged particle ray device, radiation detector, and radiation detection device" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,861, issued on Aug. 12, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Charged particle detector, charged particle ray device, radiation detector, and radiation detection device" was invented by Takumu Iwanaka (Tokyo), Yoshifumi Sekiguchi (Tokyo), Toshiaki Kusunoki (Tokyo), Shin Imamura (Tokyo) and Hajime Kawano (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a charged particle detector and a radiation detector capable of obtaining an observation image with correct contrast without saturation even when the number of signal electrons incident on a detector is increased due to an increase in the current of a primary electron beam...