ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,386,933, issued on Aug. 12, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).
"Analysis device and authentication method" was invented by Sakiko Narikawa (Tokyo), Takayuki Noda (Tokyo), Tetsuya Nishida (Tokyo) and Keiichi Kobayashi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis device according to the present disclosure, which obtains data about a sample, is characterized by comprising: a placement unit on which the sample is placed; a data obtaining unit which obtains data about the sample; a user interface unit which allows a user to make access to processing of the analysis device; a communication unit which communicates with an onl...