ALEXANDRIA, Va., April 9 -- United States Patent no. 12,270,822, issued on April 8, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Automatic analysis device" was invented by Daisuke Ebihara (Tokyo), Shinya Matsuoka (Tokyo), Makoto Nogami (Tokyo) and Taku Sakazume (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an automatic analysis device and an analysis method which are capable of reliably detecting an abnormality in a dispensing amount of a solution such as a specimen or a reagent to be dispensed and suppressing a decrease in analysis accuracy. Included are a specimen dispensing mechanism 113 that dispenses an analysis target specimen in a reaction vessel 116, a reagent dispensing mech...