US Patent Issued to Hitachi High-Tech on April 1 for "Charged particle gun and charged particle beam device" (Japanese Inventor)

ALEXANDRIA, Va., April 2 -- United States Patent no. 12,266,500, issued on April 1, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Charged particle gun and charged particle beam device" was invented by Tomoyo Sasaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a charged particle beam device capable of simultaneously achieving protection of a charged particle source against electrical discharging inside a charged particle gun and highly accurate control of the charged particle gun, for both DC and AC components. A charged particle gun according to the present disclosure is configured such that an extraction voltage and an acceleration voltage are superposed and supp...