US Patent Issued to HITACHI HIGH-TECH ANALYTICAL SCIENCE FINLAND on Sept. 9 for "Monitoring reliability of analysis of elemental composition of a sample" (Finnish Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,077, issued on Sept. 9, was assigned to HITACHI HIGH-TECH ANALYTICAL SCIENCE FINLAND OY (Espoo, Finland).

"Monitoring reliability of analysis of elemental composition of a sample" was invented by Tuomas Pylkkanen (Helsinki) and Antti Virolainen (Helsinki).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is an instrument analyzing elemental composition of a sample, including a measurement assembly including: an exciter generating an excitation directed at a target position to cause emission from the sample; a detector assembly receiving the emission from the sample at the target position, arranged to generate one or more measurement signals t...