US Patent Issued to HITACHI HIGH-TECH ANALYSIS on Aug. 26 for "Spectroscopic analysis system and spectroscopic analysis method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,063, issued on Aug. 26, was assigned to HITACHI HIGH-TECH ANALYSIS Corp. (Tokyo).

"Spectroscopic analysis system and spectroscopic analysis method" was invented by Akihiro Nojima (Tokyo), Yusuke Kaga (Tokyo), Takuya Kambayashi (Tokyo), Jun Horigome (Tokyo) and Kai Maruyama (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A spectroscopic analysis system includes: an operation panel configured to receive an input of at least one of an upper limit value of a measurement period of a spectroscopic analysis spectrum or a lower limit value of measurement accuracy as a user setting condition related to measurement of the spectroscopic analysis spectrum...