US Patent Issued to HITACHI ASTEMO on Sept. 30 for "Arithmetic operation device, testing method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,284, issued on Sept. 30, was assigned to HITACHI ASTEMO LTD. (Hitachinaka, Japan).

"Arithmetic operation device, testing method" was invented by Yasuhiro Ikeda (Tokyo), Tadanobu Toba (Tokyo), Kenichi Shimbo (Tokyo), Atsushi Arata (Hitachinaka, Japan), Takeo Yamashita (Hitachinaka, Japan), Atsushi Ichige (Hitachinaka, Japan) and Shinichi Nonaka (Hitachinaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An arithmetic operation device executes a test using a partially reconfigurable programmable logic unit, the programmable logic unit includes a test target circuit which is a user circuit, and a non-test circuit which is a user circuit which i...