ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,334, issued on Jan. 13, was assigned to Hitachi Astemo Ltd. (Hitachinaka, Japan).
"Analysis device and analysis method" was invented by Daijiro Murata (Tokyo), Masanori Kaneko (Tokyo), Daisuke Shimbara (Tokyo), Naoto Hasegawa (Hitachinaka, Japan) and Akiharu Sato (Hitachinaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis device specifies a cause when a test of test target software fails in a test environment that is an environment for executing a test. In the test, execution of test target software and confirmation of an execution result are executed by a test script without human intervention. Test data is data read into the tes...