US Patent Issued to HITACHI ASTEMO on Dec. 30 for "Inspection route generation device and inspection route generation method" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,508,705, issued on Dec. 30, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan).

"Inspection route generation device and inspection route generation method" was invented by Kaichiro Nishi (Tokyo), Nobuaki Nakasu (Tokyo) and Hiroki Morii (Hitachinaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection route generation device generates an inspection route of an external appearance inspection device which performs external appearance inspection on an inspection target based on an image imaged by an imaging unit, and includes: a storage unit which stores inspection position information indicating a plurality of inspection positions at which...