ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,252, issued on Dec. 2, was assigned to HIROSE ELECTRIC Co. LTD. (Kanagawa, Japan).
"Probe and probe device" was invented by Yujin Haga (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "[Problem]To provide a probe and a probe device that can be easily attached to and detached from circuit boards and make it possible to conduct testing of circuit boards or electronic components in an efficient manner.[Means of Solution]A first clamping piece 20 has first clamping portions 25 at one end located adjacent to the circuit board P that make contact with one surface of a circuit board P; a second clamping piece 30 has a second clamping portion 3...