US Patent Issued to HIOKI E.E. on Dec. 9 for "Measurement apparatus and measurement result display method" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,054, issued on Dec. 9, was assigned to HIOKI E.E. Corp. (Nagano, Japan).

"Measurement apparatus and measurement result display method" was invented by Naoya Kitamura (Nagano, Japan) and Junji Iijima (Nagano, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Changes over time in a measured impedance are displayed in an easy to identify manner. A measurement result display apparatus includes a processor that executes a measurement result display process that displays measurement results on a display 5 based on measurement result data produced by encoding impedances that have been measured by a measurement apparatus. During the measurement result dis...