ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,524, issued on Dec. 30, was assigned to HIOKI E. E. Corp. (Ueda, Japan).
"Measurement apparatus, and measurement method" was invented by Tetsuya Takahashi (Ueda, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement apparatus detects a voltage change in a power storage device. The measurement apparatus supplies constant current to the power storage device; measures voltage related to the power storage device supplied with the constant current; and detects the voltage change in the power storage device subjected to the measurement. The measurement apparatus also acquires the voltage change in the power storage device based on an electric...