US Patent Issued to HI on Oct. 7 for "Devices, systems, and methods for calibrating an optical measurement device" (California, Texas Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,433,517, issued on Oct. 7, was assigned to HI LLC (Culver City, Calif.).

"Devices, systems, and methods for calibrating an optical measurement device" was invented by Michael Henninger (Austin, Texas), Ryan Field (Culver City, Calif.) and Han Yong Ban (Los Angeles).

According to the abstract* released by the U.S. Patent & Trademark Office: "An illustrative optical measurement device includes a light source configured to emit light pulses directed at a target of a user. The optical measurement device further includes a detector configured to detect arrival times for photons of the light pulses after the photons are scattered by the target. The optical measurement device further include...