US Patent Issued to HEWLETT-PACKA RD DEVELOPMENT, LP. on Nov. 25 for "Image region of interest defect detection" (South Korean, American Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,482,093, issued on Nov. 25, was assigned to HEWLETT-PACKA RD DEVELOPMENT COMPANY, LP. (Spring, Texas).

"Image region of interest defect detection" was invented by Runzhe Zhang (West Lafayette, Ind.), Yousun Bang (Pangyo, South Korea), Minki Cho (Pangyo, South Korea), Mark Shaw (Boise, Idaho), Jan Allebach (West Lafayette, Ind.) and Yi Yang (West Lafayette, Ind.).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to examples, an apparatus may include a processor and a memory on which are stored computer-readable instructions that, when executed by the processor, may cause the processor to access a master image to be printed and receive a scanned ima...