ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,457, issued on Sept. 23, was assigned to HERMES TESTING SOLUTIONS INC. (Hsinchu, Taiwan).
"Probe card" was invented by Tzu-Chien Wang (Hsinchu, Taiwan), Wen-Yuan Hsu (Hsinchu, Taiwan), Ming-Hsien Chen (Hsinchu, Taiwan) and Jia-Lin Lu (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides a probe card. A module cap, on the probe card substrate, is designed to have a chute and the probe module can be installed on or uninstalled from the module cap via the chute. That simplifies the operations of assembling and disassembling the probe card and avoids positioning error."
The patent was filed on Dec. 19, 2022, un...