US Patent Issued to HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK on April 29 for "Method and measuring device for measuring objects by means of x-ray fluorescence" (German Inventor)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,287,302, issued on April 29, was assigned to HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK (Sindelfingen, Germany).

"Method and measuring device for measuring objects by means of x-ray fluorescence" was invented by Martin Leibfritz (Deckenpfronn, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement object is placed on a region of a measuring table, and an overview image of the region of the measuring table is captured by an optical device. A type of the measurement object is determined from the overview image or from an identifier on the measurement object or an identifier positioned adjacently thereto. The position and/or t...