US Patent Issued to Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik on Jan. 27 for "Method and device for determining at least one property of at least one layer using terahertz radiation" (German Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,411, issued on Jan. 27, was assigned to Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik (Sindelfingen, Germany).

"Method and device for determining at least one property of at least one layer using terahertz radiation" was invented by Ruediger Maestle (Boeblingen, Germany), Lars-Christian Anklamm (Berlin), Jens Maisenbacher (Magstadt, Germany) and Helge Ketelsen (Stuttgart, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Method for determining at least one property of at least one first layer than can be applied to a substrate using terahertz, THz, radiation, comprising: determining at least one property of the substrate, applyin...