ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,991, issued on March 4, was assigned to Hella GmbH & Co. KGaA (Lippstadt, Germany).
"Method for evaluating overlapping targets" was invented by Tai Fei (Hamm, Germany) and Yuliang Sun (Leuven, Belgium).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for evaluating overlapping targets in a two-dimensional radar spectrum, wherein the following steps are carried out: providing the two-dimensional radar spectrum, selecting at least one region of interest as an input signal from the spectrum, and performing an evaluation of the input signal to determine an information about the overlapping targets, wherein the evaluation is specific for a model or...