US Patent Issued to HEFEI INSTITUTES OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES on Oct. 14 for "Photoelectric detection and acquisition system and centroid detection method based on single-pixel detector" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,919, issued on Oct. 14, was assigned to HEFEI INSTITUTES OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES (Hefei, China).

"Photoelectric detection and acquisition system and centroid detection method based on single-pixel detector" was invented by Yingjian Wang (Hefei, China), Dongfeng Shi (Hefei, China), Jian Huang (Hefei, China), Ke'e Yuan (Hefei, China) and Linbin Zha (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A centroid detection method based on a single-pixel detector, including: S1: establishing a photoelectric detection and acquisition system, and generating three two-dimensional (2D) array matrices A, B and C; S2: generatin...