US Patent Issued to Hefei Core Storage Electronic on Dec. 30 for "Variable temperature test system for providing different test environments and operation method thereof" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,588, issued on Dec. 30, was assigned to Hefei Core Storage Electronic Ltd. (Anhui, China).

"Variable temperature test system for providing different test environments and operation method thereof" was invented by Chih-Ling Wang (Anhui, China), Qi-Ao Zhu (Anhui, China) and Dong Sheng Rao (Anhui, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A variable temperature test system and an operation method thereof are provided. The variable temperature test system includes a main control device, multiple test devices, and a variable temperature test platform. The variable temperature test platform is coupled to the main control device and the test dev...