US Patent Issued to Hefei BOE Joint Technology, Beijing BOE Technology Development on Dec. 2 for "Method of repairing gate-on-array circuit, gate-on-array circuit, and display apparatus" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,716, issued on Dec. 2, was assigned to Hefei BOE Joint Technology Co. Ltd. (Anhui, China) and Beijing BOE Technology Development Co. Ltd. (Beijing).

"Method of repairing gate-on-array circuit, gate-on-array circuit, and display apparatus" was invented by Xuehuan Feng (Beijing) and Xuelian Cheng (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of repairing a gate-on-array circuit is provided. The method includes at least one of disconnecting a X-th stage gate driving signal output terminal from a X-th stage gate driving signal output line; disconnecting a X-th stage compensation control signal output terminal from a X-th stage compensa...