US Patent Issued to Headway Technologies on March 18 for "System for controlling a critical dimension (CD) uniformity of a magnetic head device" (California Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,908, issued on March 18, was assigned to Headway Technologies Inc. (Milpitas, Calif.).

"System for controlling a critical dimension (CD) uniformity of a magnetic head device" was invented by Tom Zhong (Saratoga, Calif.), Hiroshi Omine (Santa Clara, Calif.), Jianing Zhou (Fremont, Calif.), Kunliang Zhang (Fremont, Calif.), Ruhang Ding (Pleasanton, Calif.) and Min Li (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for controlling a critical dimension (CD) uniformity of a magnetic head device are described. A film stack that is part of a system for controlling a critical dimension (CD) uniformity of a magnetic head ...