US Patent Issued to Headwall Photonics on May 13 for "Diagnostic system and methods for simultaneously detecting light at multiple detection locations in a spectroscopic system" (Massachusetts Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,295,737, issued on May 13, was assigned to Headwall Photonics Inc. (Bolton, Mass.).

"Diagnostic system and methods for simultaneously detecting light at multiple detection locations in a spectroscopic system" was invented by David Bannon (Hopkinton, Mass.), Domhnull Granquist-Fraser (Acton, Mass.), Paul Bartel (Woburn, Mass.), Kevin Didona (Chelmsford, Mass.), Carson Roberts (Roslindale, Mass.) and Blair Simon (Clinton, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device and system for non-invasively measuring wavelength-dependent changes in optical absorption of brain tissue damaged by CTE, TBI, concussion, repetitive trauma, and/or Lou Gehri...