US Patent Issued to HCL America on Nov. 4 for "Method and system for testing blocks within device under test (DUT) using reconfigurable test logic" (American, Indian Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,151, issued on Nov. 4, was assigned to HCL America Inc..

"Method and system for testing blocks within device under test (DUT) using reconfigurable test logic" was invented by Manickam Muthiah (Shrewsbury, Mass.), Karthikeyan Keelapandal Sundaram (Chennai, India) and Razi Abdul Rahim (Willowbrook, Ill.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for simultaneously testing multiple Device Under Test (DUT) internal blocks is disclosed. The method includes receiving by a reconfigurable internal buffer of a DUT, an input stimulus corresponding to at least one of a plurality of DUT internal blocks; selecting, via a control register, one or more...