US Patent Issued to Harbin Institute of Technology on Oct. 7 for "Magnetic moment measurement system and method" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,210, issued on Oct. 7, was assigned to Harbin Institute of Technology (Harbin, China).

"Magnetic moment measurement system and method" was invented by Shengxin Lin (Harbin, China), Yi Li (Harbin, China), Yuyang Bai (Harbin, China), Guodong Xia (Harbin, China), Shidong Shao (Harbin, China), Jiahong Yang (Harbin, China), Donghua Pan (Harbin, China) and Liyi Li (Harbin, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a magnetic moment measurement system and method, which belong to the technical field of magnetic moment measurement, and solve the problems of insufficient accuracy, low efficiency, and vulnerability to disturbance from an ...