US Patent Issued to HARBIN INSTITUTE OF TECHNOLOGY on May 27 for "Dark-field confocal microscopy measurement apparatus based on vortex interference" (Chinese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,563, issued on May 27, was assigned to HARBIN INSTITUTE OF TECHNOLOGY (Harbin, China).

"Dark-field confocal microscopy measurement apparatus based on vortex interference" was invented by Jian Liu (Harbin, China), Chenguang Liu (Harbin, China), Zijie Hua (Harbin, China) and Xiaoyu You (Harbin, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "This application relates to optical precision measurement and provides a dark-field confocal microscopy measurement apparatus based on vortex interference. A vortex light generation module is configured to generate vortex light with a predetermined order. A vortex light interference module is configured to: d...