US Patent Issued to HARBIN INSTITUTE OF TECHNOLOGY on March 11 for "Heterodyne interferometer based on multi-target opposite displacement measurement and measurement method thereof" (Chinese Inventors)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,247,824, issued on March 11, was assigned to HARBIN INSTITUTE OF TECHNOLOGY (Harbin, China).

"Heterodyne interferometer based on multi-target opposite displacement measurement and measurement method thereof" was invented by Haijin Fu (Harbin, China), Xiaobo Su (Harbin, China), Liang Yu (Harbin, China), Pengcheng Hu (Harbin, China), Zhaochen Pan (Harbin, China) and Zhiwei Wang (Harbin, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A heterodyne interferometer and a measurement method based on multi-target opposite displacement measurement are provided, technical points including: An output path of the laser source is sequentially arranged with a f...