US Patent Issued to HARBIN INSTITUTE OF TECHNOLOGY on July 8 for "Method and device for measuring r-value of tube in circumferential direction" (Chinese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,565, issued on July 8, was assigned to HARBIN INSTITUTE OF TECHNOLOGY (Harbin, China).

"Method and device for measuring r-value of tube in circumferential direction" was invented by Xiaolei Cui (Harbin, China) and Shijian Yuan (Harbin, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for measuring an r-value of a tube in a circumferential direction: determine a size of an annular sample, and cutting the sample from a to-be-measured tube; making speckles or circular grids on an outer surface of the sample; sleeving the annular sample in a middle of an outside of a ring segmented rigid die; filling a liquid bag with a fluid medium and cont...