US Patent Issued to HANGZHOU EVERFINE PHOTO-E-INFO on Dec. 16 for "Integrating sphere photometer spectral response measurement method and system" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,265, issued on Dec. 16, was assigned to HANGZHOU EVERFINE PHOTO-E-INFO Co. LTD. (Zhejiang, China).

"Integrating sphere photometer spectral response measurement method and system" was invented by Jiangen Pan (Zhejiang, China), Yan Huang (Zhejiang, China), Zhijiang Mao (Zhejiang, China) and Qian Li (Zhejiang, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrating sphere photometer spectral response measurement system has an integrating sphere photometer and three or more reference light sources having different peak wavelengths. The integrating sphere photometer has an integrating sphere and a broadband photodetector, wherein the broadban...