US Patent Issued to Hangzhou Baizijian Technology on Sept. 30 for "Method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,750, issued on Sept. 30, was assigned to Hangzhou Baizijian Technology Co. Ltd (Hangzhou, China).

"Method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding" was invented by Ming Ge (Hangzhou, China), Jiang Wei (Hangzhou, China), Jingxue Shen (Hangzhou, China) and Luye Ma (Hangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a method for detecting a surface defect of a copper-clad laminate based on multi-scale gridding. The method includes: S1, collecting a photographed image of the copper-clad laminate through a line-scan camera; S2, segmenting out a copper-clad region and a non-copper-clad...