ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,763, issued on June 24, was assigned to HAMILTON SUNDSTRAND Corp. (Charlotte, N.C.).
"Automated test generation" was invented by Prashanthkumar Kambadahalli Gangappa (Bengaluru, India), Harishbhai Kanubhai Patel (Gujarat, India), Santhoshkumar Maddula (Karnataka, India), Asha Rani Ramappa (Bangalore, India), Manjunath Rajashekar (Bangalore, India) and Chethan Kumar Chikkabhandara Basavarajaiah (Karnataka, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "An automated test generation system includes a processing system and a memory system in communication with the processing system. The memory system stores instructions of an automated test genera...