ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,495, issued on April 15, was assigned to Hamar Laser Instruments Inc. (Danbury, Conn.).
"Flatness measuring system, method and apparatus" was invented by Carlos Araujo (Danbury, Conn.) and Roderick M. Hamar (Sandy Hook, Conn.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus is provided for measuring flatness of a surface of a plate. The apparatus has a rail that is positionable on the plate. A laser assembly has a laser base mounted in proximity to a first end of the rail and a laser emitter is mounted to the laser base so that a laser beam is directed substantially parallel to the rail and offset laterally from the rail. A target has a lo...