ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,342, issued on Sept. 30, was assigned to Hamamatsu Photonics K.K. (Hamamatsu, Japan).
"Charged particle detector" was invented by Masahiro Hayashi (Hamamatsu, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A charged particle detector includes a microchannel plate having an input surface having electrons (charged particles) input thereon, a multiplication portion performing multiplication of electrons while maintaining positional information of the electrons, and an output surface outputting electrons multiplied by the multiplication portion; a multi-dynode having a plurality of dynodes multiplying the electrons output from the output surface,...