ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,228, issued on Sept. 2, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).
"Inspection apparatus and inspection method" was invented by Tomonori Nakamura (Hamamatsu, Japan) and Kenichiro Ikemura (Hamamatsu, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes a light source unit, cameras, a keyboard, and a controller that determines a wavelength of the excitation light, based on the information on the emission color received by the keyboard, and that controls the light source unit so that the light source unit generates excitation light with the determined wavelength. The controller determines a wavelength ...