US Patent Issued to HAMAMATSU PHOTONICS on Nov. 25 for "Sample observation device and sample observation method with planar light having different wavelengths" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,481,140, issued on Nov. 25, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Sample observation device and sample observation method with planar light having different wavelengths" was invented by Satoshi Yamamoto (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample observation device includes an irradiation optical system that emits planar light and having different wavelengths so as to pass through cross sections at different positions of the sample, a scanning unit that scans the sample with respect to the irradiation surfaces and, an imaging optical system that has an observation axis inclined with respect to the ir...