US Patent Issued to HAMAMATSU PHOTONICS on July 29 for "Optical property measurement apparatus and optical property measurement method" (Japanese Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,458, issued on July 29, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Optical property measurement apparatus and optical property measurement method" was invented by Hisanari Takahashi (Hamamatsu, Japan), Koyo Watanabe (Hamamatsu, Japan), Hiroshi Satozono (Hamamatsu, Japan), Kyohei Shigematsu (Hamamatsu, Japan) and Takashi Inoue (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical property measurement apparatus includes a pulse formation unit, a waveform measurement unit, and an optical system. The pulse formation unit is capable of changing a temporal waveform of pulsed light in accordance with a type of optic...