US Patent Issued to HAMAMATSU PHOTONICS on Feb. 11 for "Radiographic inspection method, radiographic inspection apparatus, radiographic inspection system, and radiographic inspection program" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 12 -- United States Patent no. 12,222,300, issued on Feb. 11, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Radiographic inspection method, radiographic inspection apparatus, radiographic inspection system, and radiographic inspection program" was invented by Tatsuya Onishi (Hamamatsu, Japan) and Toshiyasu Suyama (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A radiographic inspection apparatus acquires a first image and a second image; receives an input of selection of a region of interest in the first image or the second image; specifies respective first pixel values of a plurality of first pixels and respective second pixel values of a plurality of s...