US Patent Issued to HAMAMATSU PHOTONICS on Aug. 26 for "Ion detector, measurement device, and mass spectrometer" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,847, issued on Aug. 26, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Ion detector, measurement device, and mass spectrometer" was invented by Takeshi Endo (Hamamatsu, Japan) and Hiroshi Kobayashi (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present embodiment relates to an ion detector and the like that can reduce a dark current serving as a noise component. An ion detector having an electron multiplier includes a shield structure confining a potential gradient spreading in all directions starting from an input electrode into a limited space including the input electrode, and an input cable having one end ele...