US Patent Issued to HAMAMATSU PHOTONICS on April 29 for "Optical measurement device and optical measurement method" (Japanese Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,287,288, issued on April 29, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Optical measurement device and optical measurement method" was invented by Teruo Takeshita (Hamamatsu, Japan), Tomokazu Matsumura (Hamamatsu, Japan), Fusanori Kondo (Hamamatsu, Japan) and Naoki Iwata (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical measurement device includes a light detection element for detecting detection light including fluorescence generated from an immuno-chromatography test piece irradiated with excitation light and scattered light caused by the excitation light and having a phase equivalent to that of the excitati...