ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,815, issued on Aug. 19, was assigned to HAITUO INSTRUMENT (JIANGSU) Co. LTD. (Suzhou, China).
"Electronic device aging test apparatus" was invented by Dongxi Liu (Suzhou, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The invention provides an electronic device aging test apparatus, including a box body, a test chamber provided in the box body and provided with an air inlet and an air return inlet, a circulating air duct provided on a periphery of the test chamber and in fluid communication with the air inlet and the air return inlet, and a circulating fan. A fresh air port and an air outlet are provided on a wall of the circulating air duct. ...