ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,796, issued on July 8, was assigned to GUANGZHOU AUTOMOBILE GROUP Co. LTD. (Guangdong, China).
"Circuit, method and storage medium for controlling failure of vehicle MCU" was invented by Tuchao Yang (Guangdong, China), Ruifu Lai (Guangdong, China), Wenqing Chen (Guangdong, China) and Yinggong Mo (Guangdong, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit for controlling failure of a vehicle MCU includes: a failure state detector, configured to monitor the state of a MCU circuit in real time; a maintaining voltage signal generator, configured to: when the MCU circuit is detected to be in a failure state, convert a voltage from an igniti...