US Patent Issued to GUANGDONG UNIVERSITY OF TECHNOLOGY on May 27 for "Complex device fault diagnosis method and system based on multi-dimensional features" (Chinese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,149, issued on May 27, was assigned to GUANGDONG UNIVERSITY OF TECHNOLOGY (Guangzhou, China).

"Complex device fault diagnosis method and system based on multi-dimensional features" was invented by Yaohua Deng (Guangzhou, China) and Zilin Zhang (Guangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are a complex device fault diagnosis method and system based on multi-dimensional features, and the method comprises the following steps of: acquiring fault data of a target complex device, and carrying out input coding mapping and position coding; utilizing a multi-head attention mechanism and multi-head dilated convolution series conn...