US Patent Issued to GUANGDONG JINWAN GOKIN SOLAR TECHNOLOGY, GOKIN SOLAR on April 15 for "Method for solving bright line scratched during lifting of large-size silicon wafer" (Chinese Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,275,164, issued on April 15, was assigned to GUANGDONG JINWAN GOKIN SOLAR TECHNOLOGY Co. LTD (Zhuhai, China) and GOKIN SOLAR Co. LTD (Zhuhai, China).

"Method for solving bright line scratched during lifting of large-size silicon wafer" was invented by Mingquan Fu (Guangdong, China), Bing Zhu (Guangdong, China), Zhiqun Xu (Guangdong, China) and Bin Sun (Guangdong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for solving a bright line scratched during lifting of a large-size silicon wafer comprises the steps of tooling preparation, crystal bar bonding, lifting preparation, and lifting. By optimizing and adjusting a lifting process, using a...