ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,387, issued on Oct. 7, was assigned to GOERTEK OPTICAL TECHNOLOGY Co. LTD (Shandong, China).

"Screen defect detection method, apparatus, and electronic device" was invented by Xiufeng Song (Shandong, China), Yifan Zhang (Shandong, China), Jie Liu (Shandong, China) and Wenchao Zhang (Shandong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A screen defect detection method and apparatus and an electronic device are disclosed. The method comprises the following steps: identifying a number of suspected defective pixel points(S110) from a detection image of a target screen; determining a suspected defect region(S120) corresponding to a suspected def...